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Part: 100304FC
Category:
Logic
-> Military/Aerospace->ECL
Description: 100304 - Low Power Quint And/nand Gate, Package: Cerquad, Pin Nb=24
Company: National Semiconductor Corporation
Datasheet: Download 100304FC datasheet File size : 369 kB
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Datasheet text preview:
100304 Low Power Quint AND/NAND Gate
August 1998
100304 Low Power Quint AND/NAND Gate
General Description
The 100304 is monolithic quint AND/NAND gate. The Function output is the wire-NOR of all five AND gate outputs. All inputs have 50 k pull-down resistors. n n n n n 2000V ESD protection Pin/function compatible with 100104 Voltage compensated operating range = -4.2V to -5.7V Available to industrial grade temperature range Available to Standard Microcircuit Drawing (SMD) 5962-9153701
Features
n Low Power Operation
Logic Symbol
DS100304-1
Logic Equation
F = (D1a · D2a) + (D1b · D2b) + D1c · D2c) + (D1d · D2d) + (D1e · D2e). Pin Names Dna Dne F Oa Oe Oa Oe Data Inputs Function Output Data Outputs Complementary Data Outputs Description
© 1998 National Semiconductor Corporation
DS100304
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Connection Diagrams
24-Pin DIP 24-Pin Quad Cerpak
DS100304-3
DS100304-2
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2
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Above which the useful life may be impaired -65°C to +150°C Storage Temperature (TSTG) Maximum Junction Temperature (TJ) Ceramic +175°C -7.0V to +0.5V VEE Pin Potential to Ground Pin Input Voltage (DC) VEE to +0.5V Output Current (DC Output HIGH) -50 mA
ESD (Note 2)
2000V
Recommended Operating Conditions
Case Temperature (TC) Military Supply Voltage (VEE) -55°C to +125°C -5.7V to -4.2V
Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version DC Electrical Characteristics
VEE = -4.2V to -5.7V, VCC = VCCA = GND, TC = -55°C to +125°C Symbol VOH Parameter Output HIGH Voltage Min -1025 -1085 VOL Output LOW Voltage Max -870 -870 Units mV mV mV mV mV mV -1610 -1555 VIH VIL IIL Input HIGH Voltage Input LOW Voltage Input LOW Current Input High Current D2a D2e D1a D1e IIH D2a D2e D1a D1e IEE Power Supply Current -75 350 500 -25 mA -55°C to +125°C
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals -55°C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides "cold start" specs which can be considered a worst case condition at cold temperatures. Note 4: Screen tested 100% on each device at -55°C, +25°C, and +125°C, Subgroups, 1, 2 3, 7, and 8. Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at -55°C, +25°C, and +125°C, Subgroups A1, 2, 3, 7, and 8. Note 6: Guaranteed by applying specified input condition and testing VOH/VOL.
TC 0°C to +125°C -55°C 0°C to +125°C -55°C 0°C to +125°C -55°C 0°C to +125°C -55°C -55°C +125°C -55°C to +125°C -55°C to +125°C
Conditions
Notes
VIN = VIH (Max) or VIL (Min)
Loading with 500 to -2.0V
(Notes 3, 4, 5)
-1830 -1620 -1830 -1555
VOHC
Output HIGH Voltage
-1035 -1085
VIN = VIH (Min) or VIL (Max)
Loading with 50 to -2.0V
(Notes 3, 4, 5)
VOLC
Output LOW Voltage
mV mV mV mV µA
-1165
-870
Guaranteed HIGH Signal for All Inputs Guaranteed LOW Signal for All Inputs VEE = -4.2V VIN = VIL (Min)
(Notes 3, 4, 5, 6) (Notes 3, 4, 5, 6) (Notes 3, 4, 5)
-1830 -1475 0.50
250 350
µA
0°C to +125°C VEE = -5.7V VIN = VIH (Max) (Notes 3, 4, 5)
µA
-55°C Inputs Open (Notes 3, 4, 5)
3
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AC Electrical Characteristics
VEE = -4.2V to -5.7V, VCC = VCCA = GND Symbol tPLH tPHL tPLH tPHL tTLH tTHL Parameter Propagation Delay Dna Dne to O, O Propagation Delay Data to F Transition Time 20% to 80%, 80% to 20% 0.20 1.80 0.30 1.60 0.20 2.00 ns (Note 10) 0.80 2.90 0.90 2.80 0.90 3.40 ns TC = -55°C Min 0.30 Max 1.90 TC = +25°C Min 0.40 Max 1.80 TC = +125°C Min 0.30 Max 2.30 ns (Notes 7, 8, 9) Units Conditions Notes
Figures 1, 2
Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals -55°C), then testing immediately after power-up. This provides "cold start" specs which can be considered a worst case condition at cold temperatures. Note 8: Screen tested 100% on each device at +25°C temperature only, Subgroup A9. Note 9: Sample tested (Method 5005, Table I) on each mfg. lot at +25°C, Subgroup A9, and at +125°C and -55°C temperatures, Subgroups A10 and A11. Note 10: Not tested at +25°C, +125°C, and -55°C temperature (design characterization data).
Test Circuitry
DS100304-5
Notes: VCC, VCCA = +2V, VEE = -2.5V L1 and L2 = equal length 50 impedance lines RT = 50 terminator internal to scope Decoupling 0.1 µF from GND to VCC and VEE All unused outputs are loaded with 50 to GND CL = Fixture and stray capacitance 3 pF
FIGURE 1. AC Test Circuit
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Switching Waveforms
DS100304-6
FIGURE 2. Propagation Delay and Transition Times
5
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