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Part: DG507AAZ/883B
Category:
Others
-> Military/Aerospace->Military Standard
Description: CMOS Ttl-compatible Analog Mux
Company: Maxim Integrated Products
Datasheet: Download DG507AAZ/883B datasheet File size : 201 kB
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Datasheet text preview:
SCOPE: CMOS, TTL-COMPATIBLE ANALOG MULTIPLEXER Device Type 01 02 03 Generic Number DG506AA(x)/883B DG507AA(x)/883B DG509AA(x)/883B SMD Number 5962-8513107 5962-8513108 5962-8513109 Circuit Function Single 16-channel MUX/DEMUX Differential 8-channel MUX/DEMUX Differential 4-channel MUX/DEMUX
Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows: Outline Letter Maxim SMD Z 3 Z 2 Mil-Std-1835 CQCC1-N28 CQCC1-N20 Case Outline Package Code L28 L20
28-Pin Ceramic LCC 20-Pin Ceramic LCC
Absolute Maximum Ratings Voltage Referenced to VV+ to V- ............ 44V V+ to GND ...... +22V V- to GND ....... -25V Digital Inputs, Overvoltage Range (VA, VEN) ........ (V-) -4V to (V+ )+4V or 20mA whichever comes first Analog Inputs, Overvoltage Range (VS) ...... (V-) -2V to (V+ )+2V Continuous Current, S or D ............ 20mA Peak Current (Pulsed at 1ms, 10% duty cycle max) S or D........... 40mA Lead Temperature (soldering, 10 seconds) ...... +300°C Storage Temperature .......... -65°C to +150°C Continuous Power Dissipation ... TA=+70°C 20 lead LCC (derate 9.1mW/°C above +70°C) ...... 727mW 28 lead LCC (derate 10.2mW/°C above +70°C) .... 816mW Junction Temperature TJ .... +150°C Thermal Resistance, Junction to Case, JC: Case Outline 20 lead LCC ....... 20°C/W Case Outline 28 lead LCC ....... 15°C/W Thermal Resistance, Junction to Ambient, JA: Case Outline 20 lead LCC ........... 110°C/W Case Outline 28 lead LCC ....... 98°C/W Recommended Operating Conditions. Ambient Operating Range (TA) ............ -55°C to +125°C Positive Supply Voltage (V+) .......... +15V Negative Supply Current (V-) .......... -15V VAL (max) ........ 0.8V VAH (min) ........ 2.4V VEN ... 2.4V
Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
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Electrical Characteristics of DG506A/DG507A/DG509A/883B for SMD 5962-8513107/08/09
19-0364 Page 2
Rev. B of 6
TABLE 1. ELECTRICAL TESTS CONDITIONS -55 °C <=TA<= +125°C V+=+15V, V-=-15V, GND=0V V E N= 2 . 4 V Unless otherwise specified Measure address inputs sequentially, connect all unused address inputs to GND VS=+10V, VEN=0.8V, All unused inputs=-10V, VD=-10V VS=-10V, VEN=0.8V, All unused inputs=+10V, VD=+10V VD=+10V, VEN=0.8V, All unused inputs=-10V VD=-10V, VEN=0.8V, All unused inputs=+10V VD=+10V, VS=+10V, All unused inputs=-10V VD=-10V, VS=-10V, All unused inputs=+10V VS =+10V, ID=-1mA VS =-10V, ID=+1mA
Group A Subgroup Device type
TEST SWITCH Input Leakage Current NOTE 1 Leakage Current into the source terminal of an "OFF" switch Leakage Current into the drain terminal of an "OFF" switch Leakage Current from an "ON" driver into the switch (drain) Switch "ON" Resistance Switch ON Resistance SUPPLY Positive Supply Current Negative Supply Current Standby Positive Supply Current Standby Negative Supply Current DYNAMIC Capacitance: Address Capacitance: Output Switch Capacitance: Input Switch Charge Transfer Error Off Isolation Break-beforemake Time Delay
Symbol
Limits Min
Limits Max
Units
IIH I IL +IS(OFF) -IS(OFF) +ID(OFF) -ID(OFF) + I D(ON) -ID(ON)
+rDS (ON1) -rDS(ON2)
1,2,3
All
1.0 1.0 µA nA
1,2,3
All
-10 -50
+10 +50
1 2,3 2,3 2,3 1 2,3 2,3 2,3
All 01 02 03 All 01 02 03 All All
-10 -300 -200 -100 -10 -300 -200 -100
+10 +300 +200 +100 +10 +300 +200 +100 300 400 300 400 3.0
nA
nA
1 2,3 1 2,3
01,02
I+ I+ISBY -ISBY CA COS C IS VCTE VISO
VA=0V, VEN=2.4V VA=0V, VEN=2.4V VA=0V, VEN=0V VA=0V, VEN=0V V+=V-=0V, f=1MHz, NOTE 2 V+=V-=0V, f=1MHz, NOTE 2 V+=V-=0V, f=1MHz, NOTE 2 VS=GND. VGEN=0V to 5V, NOTE 2 VEN=0.8V, RL=1k, f=100kHz, CL=15pF, VS=7Vrms RL=1000, CL=50pF, Figure 3
1 ,2,3 1 ,2,3 1 ,2,3 1 ,2,3
4 4
03 All 01,02 03 All
mA 2.4 -1.0 3.0 mA 2.4 -1.0 mA mA
01,02 03 01 02 03 All All All All
4 7 7
12 10 90 50 25 12 10 -50 25
pF pF pF mV dB ns
tD
9
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Electrical Characteristics of DG506A/DG507A/DG509A/883B for SMD 5962-8513107/08/09
19-0364 Page 3
Rev. B of 6
TABLE 1. ELECTRICAL TESTS CONDITIONS -55 °C <=TA<= +125°C V+=+15V, V-=-15V, GND=0V VAH=2.4V, VAL=0.8V Unless otherwise specified RL=10k, CL=50pF
Group A Subgroup Device type
TEST Propagation Delay Times: Address Inputs to I/O Channels Enable to I/O
Symbol tON(A) tOFF(A) tON(EN)
Limits Min
Limits Max 500
Units
9 All 10,11 9
ns 1000 500 ns 1000
tOFF(EN) NOTE 1: Input current of one input mode. NOTE 2: Guaranteed, if not tested, to the limits specified.
RL=1000, CL=50pF
All 10,11
FIGURE 3: Break-Before-Make Interval: See Commercial Datasheet. TRUTH TABLE A3 X L L L L L L L L H H H H H H H H A2 X L L L L H H H H L L L L H H H H A1 X L L H H L L H H L L H H L L H H A0 X L H L H L H L H L H L H L H L H EN L H H H H H H H H H H H H H H H H DG506A Selected Channel None 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 DG507A Selected Channel None 1A, 1B 2A, 2B 3A, 3B 4A, 4B 5A, 5B 6A, 5B 7A, 7B 8A, 8B TERMINAL CONNECTION TERMINAL 01 NUMBER DG506A L28 1 V+ 2 NC 3 NC 4 S16 5 S15 6 S14 7 S13 8 S12 9 S11 10 S10 11 S9 12 GND 13 NC 14 A3 15 A2 16 A1 17 A0 18 EN 19 S1 20 S2 21 S3 22 S4 23 S5 24 S6 25 S7 26 S8 27 V28 D
A2 X L L L L H H H H
A1 X L L H H L L H H
A0 X L H L H L H L H
EN L H H H H H H H H
02 DG507A L28 V+ DB NC S8B S7B S6B S5B S4B S3B S2 B S1B GND NC NC A2 A1 A0 EN S1A S2A S3A S4A S5A S6A S7A S8A VDA
03 DG509A L20 NC A0 EN VIN 1A NC IN 2A IN 3A IN 4A OUT A NC OUT B IN 4B IN 3B IN 2B NC IN 1B V+ GND A1
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Electrical Characteristics of DG506A/DG507A/DG509A/883B for SMD 5962-8513107/08/09
19-0364 Page 4
Rev. B of 6
TRUTH TABLE: A1 A0 X X L L L H H L H H
EN L H H H H
DG509A CHANNEL SELECTED NONE 1A, 1B 2A, 2B 3A, 3B 4A, 4B SMD NUMBER 5962-85131073C 5962-85131083C 5962-85131092C PACKAGE CODE 28 LCC 28LCC 20 LCC
ORDERING INFORMATION: DG506AAZ/883B DG507AAZ/883B DG509AAZ/883B
QUALITY ASSURANCE Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in MilStd-883. Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015: 1. Test Condition, A, B, C, or D. 2. TA = +125°C minimum. 3. Interim and final electrical test requirements shall be specified in Table 2. Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B, C, and D inspection. Group A inspection: 1. Tests as specified in Table 2. 2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted. Group C and D inspections: a. End-point electrical parameters shall be specified in Table 1. b. Steady-state life test, Method 1005 of Mil-Std-883: 1. Test condition A, B, C, D. 2. TA = +125°C, minimum. 3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883. TABLE 2. ELECTRICAL TEST REQUIREMENTS Mil-Std-883 Test Requirements Subgroups per Method 5005, Table 1 1
Interim Electric Parameters Method 5004 Final Electrical Parameters 1*, 2, 3, 9 Method 5005 Group A Test Requirements 1, 2, 3, 4**,7, 9, 10***, 11*** Method 5005 Group C and D End-Point Electrical Parameters 1 Method 5005 * PDA applies to Subgroup 1 only. ** Subgroup 4 capacitance measurements shall be measured only for the initial test and after process or design changes which may affect capacitance. *** Subgroups 10 and 11, if not tested shall be guaranteed to the limits of Table 1. ---------------------------Electrical Characteristics of DG506A/DG507A/DG509A/883B for SMD 5962-8513107/08/09 19-0364 Page 5 Rev. B of 6
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